Used JEOL JSM 6100 #9257837 for sale

JEOL JSM 6100 is a scanning electron microscope (SEM) designed for a broad range of applications such as imaging and analysis. It is a reliable and highly versatile instrument that has been in use since its original launch in the early 2000s. JSM 6100 is equipped with a 5-axis chamber that allows the SEM to take images from various points of view. This gives unmatched flexibility and the highest resolution. Its features include accommodation for changing positions to take images of different sample angles from 0-60°, coupled with a 5-axis control unit that continually aligns the electron column for accurate imaging of high-aspect-ratio features. Its optical access and vibration isolation also ensures the highest resolution and contrast. JEOL JSM 6100 is capable of capturing nanometer-scale resolution imagery and 3D volume data of specimens as thin as 1nm. It is often used for advanced material and failure analysis, such as the characterization of transistors, 3D metrology/profiling applications, and visualizing the properties of type of materials. JSM 6100 is also suitable for examining biological specimens such as tissue, and plants and powders that are difficult to observe using a light microscope. The microscope is equipped with a wide range of automated stages. This includes a wide stage that can scan large specimen areas quickly and the sample exchange stage which allows a number of samples to be mounted quickly and accurately. The microscope also features an integrated high-voltage power supply, which helps reduce operating costs and maintenance time. JEOL JSM 6100 also includes advanced image processing tools that enhances the image quality of STEM images and adjusts beam currents to reduce Environmental Devices on sample surfaces. In addition, JSM 6100 also features an in-column EDS system (Energy Dispersive Spectrometry) data acquisition and interchangeable detectors that allows the user to obtain elemental analysis of the sample. JEOL JSM 6100 is a powerful and reliable scanning electron microscope that is suitable for a wide range of applications. Its features and capabilities make it a highly versatile instrument that will meet the needs of a variety of materials science researchers, failure analysists, and biologists.