Used JEOL JSM 6300 #293658285 for sale

JEOL JSM 6300 scanning electron microscope (SEM) is a leading-edge instrument that combines the latest scanning electron and acceleration technology with a high-resolution imaging and specimen analysis performance. It is ideal for research and industry applications where there is a need for rapid and accurate imaging and analysis. The system is capable of achieving 30kV to 5MV of acceleration voltage for an optimized resolution and contrast resulting in clean image formation without the need for beam correction. Its high-resolution field emission gun with a spot size of 1nm allows for detailed visualization of smaller particles at larger magnifications. It also allows for capturing images for analysis and combining them with a wide variety of analytical programs and software. JEOL JSM-6300 scanning electron microscope has an automated universal stage with a built-in tilt and rotation system for 360-degree sample view. The stage is compatible with a variety of sample holders, such as a diamond grid stub, Inverted Specimen Holder and Detachable Gen-Rotation Sample Holder, to ensure the secure handling and containment of specimens. Advanced imaging features such as Multi-Focusing, Wide Field Image Transfer, Multi-Field Image Capture and Sequence Image Capture are available for seamless and efficient imaging. With high-level image processing, automated particle counting and imaging, and distortion-free image projection along with versatile laboratory automation tools, JSM 6300 is a reliable platform for imaging and analysis. JSM-6300 scanning electron microscope is also equipped with a CCD camera for secondary electron images, with exposure parameters adjustable for optimal brightness, contrast and resolution. The camera features global internal shutter with an accurate timing system and frame transfer CCD for quick image capture. In addition to its renowned imaging capabilities, JEOL JSM 6300 SEM is also equipped with analytical components, such as a dual detector for Energy Dispersive X-Ray Spectrometry (EDS) and Electron Backscatter Diffraction (EBSD). The EDS detector offers superior resolution and dynamic range with automatic sample switching for improved analysis speed and accuracy. The EBSD detector provides a rapid elemental mapping capability for samples with complex textures and compositions. Finally, JEOL JSM-6300 SEM is controlled with an intuitive touchscreen user interface and a unique 3D Navigation Window. This advanced software suite allows researchers to manage and manipulate all types of imaging and analysis data for comprehensive and efficient analysis. Furthermore, JSM 6300 is suitable for a wide range of applications such as semiconductor device inspection, surface metrology and material research.