Used JEOL JSM 6300 for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 6300

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Scanning Electron Microscope (SEM).

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Scanning Electron Microscope (SEM) X-Y have motors No controller Z-Axis is motorized Si Drift detect

341

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Scanning Electron Microscope (SEM) Resolution: 1.5 nm @ 30 kV Maximum chamber / Sample size: 5" Samp

183

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Scanning Electron Microscope (SEM) PC Controlled Voltage: 0.2 kV - 30 kV Magnification: 10 x - 300,0

297