Used JEOL JSM 6300 #9314149 for sale

JEOL JSM 6300 is an advanced scanning electron microscope (SEM) designed for high-resolution imaging and analysis applications. It is capable of providing superior image quality and spatial resolution when compared to traditional optical microscopes. JEOL JSM-6300 features a large 17.0 cm x 11.5 cm secondary electron detector with a pixel size of 25.4 μm and a 4.2 cm x 4.2 cm backscattered electron detector with a pixel size of 9.2 μm. The system is equipped with an ultra-high vacuum (UHV) stage with a low noise UHV sample holder, allowing for imaging and analysis of both dry and wet samples without contamination. Furthermore, the system is capable of producing large depth-of-field imaging, which allows users to obtain detailed images of large surface areas. In addition to imaging and analysis capabilities, JSM 6300 also features various types of spectroscopy, including e-line and wavelength dispersive x-ray spectroscopy (WDS). E-line spectroscopy is used for elemental analysis by measuring the energy of specific x-ray lines emitted from the sample. WDS is used for surface analysis by measuring using multiple x-ray lines to measure both elemental composition and distribution. JSM-6300 also includes integral e-gun which is a low voltage electron gun, designed to provide ultra-low background noise and extended operating parameters. This enables users to obtain high contrast images with excellent uniformity over large surface areas. JEOL JSM 6300 is a powerful scanning electron microscope, providing excellent image quality, resolution and analysis capabilities. It is suitable for a variety of applications, including semiconductor and materials science research, metallurgy and failure analysis, as well as life sciences.