Used JEOL JSM 6300 #293750615 for sale

JEOL JSM 6300 is a state-of-the-art scanning electron microscope (SEM) that gives users the highest resolution for imaging and analytical capabilities. Featuring an ultra-high vacuum (UHV) chamber for ultra-high resolution imaging up to 5 nm, JEOL JSM-6300 is equipped with built-in features and precision tools needed to get the job done. The Field Emission Gun (FEG) with in-lens secondary electron detector produces very low electron beam current, enabling the user to produce very high-resolution images with low sample destruction rates. The in-lens detector has high throughput and low chamber background contribution, allowing for a deeper insight into the sample being inspected. JSM 6300 SEM includes a high quality charged coupled device (CCD) camera for capturing both low magnifications and higher-resolution images. The CCD camera is directly coupled to the detector in the specimen chamber, enabling magnifications up to 7000x. JSM-6300 also includes an EDS (energy dispersive spectrometer) detector that can provide elemental analysis of a sample. The detector is integrated into the SEM and allows for the identification and mapping of elements within a sample with high resolution. JEOL JSM 6300 also includes an automated stage that can be used to move a sample around the chamber, giving users the ability to image different areas of a sample without having to manually adjust the sample position. Additionally, the stage can be programmed to perform traces and line scans across the surface of the sample. The combination of features built into JEOL JSM-6300 give users the ability to produce very high-resolution imaging of samples, as well as conduct accurate analyses of samples. With the ability to image and analyze samples at nano-scale resolution, JSM 6300 is the ideal tool for advanced microscopy and elemental analysis.