Used JEOL JSM 6300 #9234610 for sale

JEOL JSM 6300 is a scanning electron microscope (SEM) designed specifically for imaging and analyzing a variety of samples, such as metals, ceramics, polymers, semiconductors, composites, and other materials. It provides a high resolution imaging capability for extremely small sample features with a minimum feature size as small as 0.5nm. JEOL JSM-6300's design features an advanced High Resolution Digital Imaging Program for sampling and imaging a variety of sample sizes. It combines two distinct operating modes for enhancing imaging capabilities: secondary electron imaging (SEI) and backscattered electron imaging (BSEI). SEI is well suited for inspecting and analyzing surface topographies, while BSEI is ideal for obtaining detailed information on sample composition and material morphologies. JSM 6300 has a compact design with versatile operation features and an intuitive user interface. Its advanced stage design permits exploration over a wide range of fields of view, as well as motion ranges in the x, y and z axes. In addition, JSM-6300 features a large specimen chamber capable of accommodating up to two 4" sample holders for efficient sample manipulation. JEOL JSM 6300 also has an array of analytical capabilities, such as energy dispersive X-ray (EDX) spectral elements analysis, electron backscattering diffraction (EBSD) analysis and phase mapping capabilities. It has optimal user control for customizing the imaging parameters to acquire detailed and accurate images. With its superior sensitivity, stability, and flexibility, JEOL JSM-6300 is well suited for a variety of applications in both research and manufacturing environments. Its versatile features and functionality make it suitable for many imaging and analysis jobs, meeting the needs of many users in the industrial, scientific, and academic fields.