Used JEOL JSM 6330F #9041540 for sale

JEOL JSM 6330F is a tabletop-style scanning electron microscope (SEM) used to investigate the microstructural or surface features of a variety of materials. This instrument utilizes secondary electrons generated by an electron beam which is focused onto the specimen surface to produce an image or analyze the surface topography, composition or other physical characteristics of the material. JEOL JSM-6330F operates in either high-vacuum or low-vacuum mode and is capable of magnifications up to 32,000x. The low-vacuum mode of JSM 6330 F allows for non-conductive specimens, such as carbon, to be prepared without metal coating. This mode also supports low-vacuum imaging of highly-conductive materials, such as gold. The high-vacuum mode provides a shorter working distance which permits larger working areas and finer spot sizes. JSM-6330F is capable of imaging in true color or false color. True color SEM enables samples to be scanned in their natural color, while false color SEM eliminates any color differences so the image is produced entirely in shades of gray. JEOL JSM 6330 F is outfitted with an Everhart-Thornley secondary electron detector to improve signal-to-noise ratios as well as additional components such as a cryo-stage, stage heating and cooling stages, variable pressure stages and the ability to automate sample scanning. The attached software is incredibly user friendly and includes a range of additional features such as particle size mapping, image editing, image processing and quantitative analysis. JSM 6330F is a robust, versatile SEM perfect for viewing and analyzing small and delicate features, such as microscopic fractures or tiny surface-matrix composites. The inclusion of the E-T detectors allows for greater detector coverage, increased detection efficiency and improved signal-to-noise ratio. With its customizable software options and extended range of accessories, JEOL JSM 6330F is a powerful yet affordable tabletop scanning electron microscope for the study of a variety of materials in academic and industrial environments.