Used JEOL JSM 6330F for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 6330F

Have one to sell?

Submit for sale

4 results found

Filters

Clear All

4 results

Popular Product

Field Emission Scanning Electron Microscope (FE-SEM) With EDAX OXFORD INCA 250 EDS System OXFORD EDX

164

Can't find what you are looking for?

Popular Product

Scanning electron microscope (SEM) Electron beam energy: 0.2-40 keV Secondary electron imaging: Re

317

Popular Product

Scanning electron microscope (SEM) BRUKER EDX Element analyzer (LN2 Free) E-Beam tip Currently wareh

150

Popular Product

Scanning Electron Microscope (SEM).

134