Used JEOL JSM 6330F for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 6330F

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Field Emission Scanning Electron Microscope (FE-SEM) With EDAX OXFORD INCA 250 EDS System OXFORD EDX

154

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Scanning electron microscope (SEM) Electron beam energy: 0.2-40 keV Secondary electron imaging: Re

284

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Scanning electron microscope (SEM) BRUKER EDX Element analyzer (LN2 Free) E-Beam tip Currently wareh

139

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Scanning Electron Microscope (SEM).

124