Used JEOL JSM 6330F #9164163 for sale

JEOL JSM 6330F is a scanning electron microscope (SEM) capable of producing high-resolution images of a variety of surfaces down to a 50 nanometer resolution. Its electron beam imaging system is equipped with an ultra-high resolution secondary electron detector capable of imaging with 10-bit (1024 intensity levels) contrast, allowing for detailed analysis of sample fine features across the sample. This instrument is capable of a wide range of analytical techniques, from orientation imaging microscopy (OIM), catho-optical microscopy (COM), and Even Fourier transform imaging (EFTEM). JEOL JSM-6330F is equipped with a state-of-the-art vacuum system with a pumping speed of 20m3/hr. This vacuum system offers a pressure range of 10-6 mbar to 10-2 mbar and ensures conditions are suitable for the operation of the secondary electron detector and low-energy electrons. JSM 6330 F can be operated without heating the sample surface (cold stage or thermospray accessory) or by using an optional heating element that can reach temperatures up to 650°C. JSM 6330F can be programmed with a range of analytical techniques. Its Energy Dispersive X-ray Spectroscopy (EDX) feature offers a range of analytical capabilities including elemental mapping, particle imaging, and depth profiling among others. The Particle Induced X-ray Emission (PIXE) feature allows for non-destructive elemental analysis of the sample with high spatial resolution and sensitivity. The Secondary Electron Microscopy (SEM) mode of JSM-6330F is especially suited for imaging ligand-treated structures and molecules. Its auto-stigmator feature offers exceptionally low image aberrations allowing for detection of features down to the nanometer level. The energy-filtered imaging mode enables analysis of fine surface features such as crystalline structures with a resolution as low as 50nm. JEOL JSM 6330 F can also be operated in variable pressure mode (VP) allowing for imaging of non-conductive samples that may be damaged by electron bombardment in a traditional scanning electron microscope (SEM). The VP mode can be performed up to an atmosphere of 10-1 mbar and offers a unique imaging environment where non-conductive samples can be observed even at resolutions as low as 10nm. Finally, JEOL JSM 6330F is equipped with an advanced image processing suite offering enhanced sample analysis options. The image processing software allows for automated image analysis, quantitative image analysis, 3D reconstructions, and other types of automated analysis. It also allows for interactive analysis of samples with a fast reconstruction speed. Overall, JEOL JSM-6330F is an extremely powerful and versatile SEM that is capable of producing high-quality images at exceptionally high resolutions with a variety of analytical capabilities. Its advanced vacuum, heating and image processing systems make it a premier microscope choice for researchers who demand the most from their instrument.