Used JEOL JSM 6330F #9131143 for sale

JEOL JSM 6330F is an advanced scanning electron microscope (SEM). It is designed for a range of applications from characterizing small particles to nanometer scale imaging. This SEM offers several advantageous features, including an integrated mini-column design, a large specimen chamber, and a flat specimen stage. The 65kV mini-column design allows precise beam positioning and image quality. It allows for precise beam positioning over a large area, providing high resolution imaging. The resolution of this SEM is up to 1.2 nanometers on a backscattered electron detector. The image magnification is 0.3x to 300x, with a resolution of 0.8 nanometers. The large specimen chamber can accommodate a wide variety of specimens in a variety of sizes and configurations. This allows for efficient and consistent analysis. The stage of the SEM can hold specimens up to 100 millimeters in size, enabling a wide range of research scenarios. JEOL JSM-6330F also allows for high-speed automated imaging. It is capable of scanning up to 5 different specimen fields in a single image scan. This is especially useful for research requiring multiple scans or for analyses of large areas. This SEM is equipped with several detectors for collecting various types of data. These include a secondary electron detector, a backscattered electron detector, a low-energy electron detector, and an energy dispersive spectrometer detector. Each type of detector offers different kinds of data that can be used to gain more information about a specimen. JSM 6330 F is an optimal tool for work in the field of nanotechnology. Its high resolving power, along with its automated imaging capabilities, allows researchers to study specimens at the nanometer level. This allows researchers to gain valuable insights into the structure and composition of materials on a nanoscale level. Overall, JEOL JSM 6330 F is an advanced scanning electron microscope that offers a range of benefits. It is capable of high resolution imaging, automated imaging, multiple detectors, and a large specimen chamber. This makes it the ideal tool for research and applications at the nanoscale level.