Used JEOL JSM 6330F #9071903 for sale

JEOL JSM 6330F scanning electron microscope (SEM) is a versatile tool for performing the detailed analysis of a wide range of objects. The powerful, multi-functional imaging system provides excellent resolution and high contrast for a variety of sample types. Its compact size and lightweight design make it popular with laboratories of all sizes. JEOL JSM-6330F offers a number of imaging techniques including back-scattered electron imaging, secondary electron imaging, BSE color composite imaging, and STEM (Scanning Transmission Electron Microscopy). It also includes a variable focus, a dedicated secondary electron detector, and an effective in-column energy filter. With a high powered inverter, the microscope can operate a full range of magnifications from 15x to more than 200,000x. Due to its 6-axis motorized sample holder, JSM 6330 F can handle a wide range of sample types and provide precise automated sample preparation and scanning. In addition to its imaging capabilities, JSM-6330F is also equipped with three advanced analytical systems that enable sophisticated analyses such as EDS (Energy Dispersive Spectroscopy), WDS (Wavelength Dispersive Spectroscopy) and EDX (Energy Dispersive X-ray Spectroscopy). These systems allow for the elemental or compositional analysis of any sample. JEOL JSM 6330 F offers excellent imaging quality as well as a variety of advanced analytical capabilities. Its robust scanning and imaging functions help users obtain high-resolution images and highly accurate analytical results. It is an ideal tool for researchers and scientists in a variety of fields who need a reliable and versatile SEM.