Used JEOL JSM 6330F #9258244 for sale

JEOL JSM 6330F is a scanning electron microscope (SEM) that utilizes electron column technology to accommodate a wide range of techniques including image analysis, elemental or chemical analytical work, and three-dimensional surface profiling. It is designed for nanometer scale imaging and analysis of surfaces, with an image resolution of up to 1 nm. The electron column is a powerful triple-field emission source with two gun columns and a separate electron optics column. This allows for high speed scanning with varying beam energies, which is necessary for producing high quality images, as well as for chemical analysis and measurement. The SEM features a high resolution CCD camera and variable intensity detectors for capturing SEM images. The microscope is also equipped with a wide range of analytical and imaging capabilities. These include backscatter electron (BSE) imaging, which can be used to identify the different elements that make up a sample, as well as X-ray and energy-dispersive spectroscopy (EDS) analytical techniques, which are capable of detecting and measuring the chemical composition of specimens. In addition, JEOL JSM-6330F is equipped with a computer-controlled stage system, which allows for precise automated and manual movement of the specimen during the imaging process. The software also includes automated features for parameter setup, image acquisition and analysis, as well as automated adjustment of the image contrast and brightness. The microscope also includes an advanced 3D model-building capability, which can be used for creating detailed 3D models of specimens. The model-building software provides the user with an interface to quickly create high-resolution 3D models. The 3D models can then be used for visualizing a specimen, as well as for further analysis. All in all, JSM 6330 F SEM is a powerful tool for imaging and analysis of nanometer scale features. It has a wide range of imaging and analytical capabilities, including advanced image processing and 3D modeling features, that make it an ideal tool for researchers studying nanoscale materials.