Used JEOL JSM 6330F #9288334 for sale

JEOL JSM 6330F is an advanced scanning electron microscope (SEM) that offers unparalleled imaging capabilities. This state-of-the-art instrument utilizes secondary electrons (SE), backscattered electrons (BSE), secondary-electron image composites (SEIC) and a variable convergence angle technique for enhanced resolution and image contrast. One of the features of JEOL JSM-6330F that sets it apart from other SEMs is its large field of view, with a scan mode of up to 20x to a maximum resolution of 1μm. This greatly expands the scope of imaging, allowing users to capture images of larger, more complicated samples in the best possible detail. In addition, JSM 6330 F comes with an auto-focus detector that quickly refocuses without user intervention, helping to ensure maximum image accuracy. JSM-6330F has an electron column capable of working at one of five accelerating voltages ranging from 5kV to 30kV. This facilitates the examination of a wide range of sample types, from organic, light materials to both large and small metal alloys. By adjusting the operating voltage, finer and sharper details can be identified in a sample with minimal risk of accidental damage. The instrument is designed to provide maximum versatility, while still being easy to use. Featuring an intuitive user interface and an automated sample stage, JEOL JSM 6330 F quickly and reliably sets up and aligns the sample for analysis and alignment. It also has automated functions such as particle counting, to give additional insights into a sample. Other features of JSM 6330F include a vacuum system with a roughing pump, an integral sample cooling system to prevent damage to the sample, and an ion emission detector for improved signal-to-background noise ratio. All this adds up to make JEOL JSM 6330F an exceptional research tool for scientists in a variety of fields.