Used JEOL JSM 6340F #9003281 for sale
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ID: 9003281
SEM
Specifications:
a. Performance
SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV)
2.5 nm guaranteed (Acc. V. = 1kV)
Magnification : x 25 (WD 25 mm) to x 650,000
Accelerating Voltage : 0.5 to 2.9 kV (10 V steps)
2.9 to 30 kV (100 V steps)
Probe Current : 2 x 10-9 to 10-13 A
Image Mode : SEI, LEI
b. Electron Optical System
Electron Gun : High-resolution Conical Anode Field Emission Gun with Cold Cathode
Alignment : Mechanical and Electromagnetic Deflection
Condenser lens (C.L.) : Electromagnetic 2-stage zoom lens
Objective lens (O.L.) : Superconical CF (corrected field) lens
O.L. Apertures : Variable, 4-step click-stop type
c. Specimen Stage
Type : Fully Eccentric Goniometer
Movement : X = 50mm, Y = 70mm, Z = 23mm
Tilt = -5* to +45*
Rotation = 360* endless (motor driven)
Motorized movement for all 5 axes
d. Specimen Chamber
Max Specimen size : 100mm or 4inch diameter
Specimen Exchange: Airlock type (100mm dia. or less)
EDS Detector : WD = 15 mm
Take-off Angle = 20*
e. Display System
Display Tubes
Observation: One, 17-inch color CRT
Recording : One, 5-inch ultra high resolution short-persistence CRT
Scanning Modes : PIC (Full, ½ & ¼ frame), Bright-up, line Profile, Spot
Display Modes : NORM, WFM, D-MAG, YZ Mod, FREZ, DUAL Display, Different magnification Images
Auto Functions : Auto Focus, Auto Astigmatism Correction, Auto Contrast & Brightness
Image Memory : 1280 x 1024 x 8 bits.
JEOL JSM 6340F is a scanning electron microscope that provides versatile imaging capabilities for a wide range of applications. Its advanced design promises superior performance in terms of resolution, throughput, and reliability. It is equipped with a variable pressure chamber, which ensures a secure environment for the samples by providing a stable air pressure. This eliminates the need for sample cryogen freezing in many applications. JEOL JSM-6340F features a field emission type electron gun, which combines a low beam divergence angle with a high brightness. This makes it ideal for high-resolution imaging. The device is also fitted with an advanced energy filter, which provides precise energy control of the electron beam. This allows the user to adjust the type of imaging to their specific needs. JSM 6340 F boasts an impressive 200kV accelerating voltage, resulting in an enhanced imaging resolution of up to 3nm. This makes it an ideal choice for high-detail imaging applications, including medical and material sciences. Its high magnification capacity of up to 250,000x ensures that even the smallest features can be identified. JSM 6340F also features a pulsed recontamination-free SEC scanning system. This creates a stable observation environment and minimizes the contamination of the samples. This makes it suitable for applications that require clean and contamination-free environment, such as in the field of nanotechnology. Its easy-to-use design and intuitive user interface provide an easy and convenient operation, even for the inexperienced user. Furthermore, the device can be operated in either of two operating modes: manual or automatic. This allows the user to select the best mode of operation for their specific application. In conclusion, JSM-6340F is an advanced scanning electron microscope that provides excellent imaging capabilities. Its performance is enhanced by features such as a variable pressure chamber, an advanced energy filter, a field emission gun, and pulsed recontamination-free SEC scanning system. Its easy operation and intuitive user interface further ensure an enjoyable user experience. As such, it is an ideal choice for high-resolution imaging applications in the fields of medical and material sciences.
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