Used JEOL JSM 6340F for sale

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JEOL JSM 6340F #9276338
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JEOL

JSM 6340F

Microscope.
78
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JEOL JSM 6340F #145143
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JEOL

JSM 6340F

Scanning electron microscope, 4", parts system Specifications: In-lens secondary electron detector
245
JEOL JSM 6340F #9364860
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JEOL

JSM 6340F

Field Emission Scanning Electron Microscope (FE-SEM).
135
JEOL JSM 6340F #9003281
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JEOL

JSM 6340F

SEM Specifications:   a. Performance SEI Resolution : 1.2 nm guaranteed (Acc. V. = 15kV) 2.5 nm gu
145