Used JEOL JSM 6340F #9364860 for sale

JEOL JSM 6340F is a scanning electron microscope (SEM) that is used to produce high resolution images of small, morphologically complex structures. It is capable of detecting down to features as small as 0.1 nanometers, allowing the visualization of small structural features without the need for further magnification. It features a field emission electron source that can generate electron beams with less than 5 milliamperes of current, enabling images with high resolution and image stability. Additionally, the SEM's digital vacuum equipment provides a clear vacuum in the column, resulting in a highly stable imaging platform. In order to acquire quality images without artifacts, JEOL JSM-6340F offers an advanced secondary electron detector that has a light blocker and in-column energy filter. The light blocker helps to reduce image distortion due to external light sources, while the in-column energy filter can be adjusted to increase contrast by allowing optimal electron energy adjustment. This results in higher contrast images, especially in identifying small features. Moreover, the specimen chamber of JSM 6340 F supports a variety of viewing modes including variable pressure (VP), low vacuum (LV), and scanning transmission electron microscopy (STEM) modes. The VP mode suppresses charging effects on the object, while the LV mode facilitates imaging of non-conductive samples. As for STEM, the microscope's aberration-corrected objective lens allows for quantification of sample composition. JEOL JSM 6340 F is also well-equipped with an in-column imaging system. This unit comprises an in-column deflector and scan coils for sample positioning and focusing, as well as a precision scan stage, which allows for stable specimen mounting and reproducible scanning. Furthermore, a built-in low drift vibration isolation machine provides additional support for minimizing cross-sectional distortion and tilting of sample images caused by camera jolts. JEOL JSM-6340 F comes with a precise alignment and an automated sweeping mode for fine-tuning during scanning mode. The alignment systems accurately and quickly align the sample for optimal scan resolution. There is also the built-in auto-focus tool that helps to maintain a consistent image quality and resolution. In conclusion, JSM-6340 F is an advanced scanning electron microscope, capable of producing high resolution images with low drift and low noise. It is equipped with various features and accessories that augment its functionality, making it an ideal choice for imaging morphologically complex structures.