Used JEOL JSM 6340F #9276338 for sale

JEOL JSM 6340F is a scanning electron microscope (SEM) that is specifically designed for highly detailed, high resolution imaging for a wide spectrum of applications. JEOL JSM-6340F is an aberration corrected field emission gun SEM, which offers unsurpassed semiconductor device and circuit analysis, failure analysis, and morphological examination. It is backed by an ultra-stable and reliable nanoscale imaging equipment for utmost quality imaging. JSM 6340 F has a wide range of imaging capabilities including backscattered electron (BSE) imaging, secondary electron (SE) imaging, and compositional spectroscopy imaging. It can detect even the smallest cryogenic sample changes with integrated EDS detector capabilities. Its high end field emission electron source offers ultra-high stability and resolutions down to 0.8 nanometers. The advanced optical column utilizes a two-lens astigmatic system that offers an extremely stable imaging environment with an advanced optical unit. It features an angular deflector that allows for angle correction during operation, making it an ideal tool for higher imaging resolution. JSM 6340F features a variety of advanced features that make it an ideal choice for advanced imaging. It is equipped with a high vacuum chamber that has been designed to allow sample imaging in an ultra-high vacuum environment. The chamber can also be operated at lower vacuums, making it suitable for examining samples that require low vacuum conditions. It also offers a variety of advanced control capabilities and functions. It includes a control panel for adjusting the field emission current and accelerating voltage. It also has the ability to control focus and stigmator settings with a built-in joystick. It also features an automatic deflection reversal machine that allows for rapid imaging with constant object size and magnification. In addition, JEOL JSM 6340 F offers advanced imaging capabilities through its software. It features an enhanced version of TEM imaging software that provides users with the tools they need to perform aberration corrected TEM imaging tasks. It also includes a powerful 3D image reconstruction and analysis software that allows users to combine information from various images to create three-dimensional images of samples. JSM-6340F is an advanced imaging tool that can help users create highly detailed, high resolution imaging for a wide range of applications. It is capable of detecting the smallest cryogenic sample changes and offers a variety of advanced control and imaging capabilities. With its advanced optical asset, it can provide users with the utmost quality imaging and it is backed by an ultra-stable and reliable nanoscale imaging model.