Used JEOL JSM 6340F #9076781 for sale
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ID: 9076781
Vintage: 1998
FE Scanning Electron Microscope (FE-SEM)
BSE Capability
Noise canceler: Detector
Grounding terminal: 1,100 Ω or less
Pump:
Ion pumps
Oil rotary pump
Oil diffusion pump
Secondary electron image resolution:
15 kV: 1.2 nm
1 kV: 2.5 nm
Magnification
LM Mode: 25x to 2,000x Zoom mode (MAG)
HR Mode: 500x to 650,000x (WD 8 mm)
Electric optical system:
Electron gun
Type: Cold-cathode field emission
Accelerating voltage: 0.5 to 30 kV
0.5 to 2.9 kV Variable in 0.01 kV steps
2.9 to 30 kV Variable in 0.1 kV steps
Emission current: 4,8,12 µA
Alignment:
Mechanical horizontal shift
Electromagnetic deflection
Lens system:
Condenser lens:
(2) Stages
Electromagnetic
Zooming system
Aperture angle Control Lens (ACL): Electromagnetic lens
Electron Optical System (EOS) Operating modes
Image scanning:
High Resolution (HR)
Low Magnification (LM)
Alignment patterns (ALP)
Focusable working distance: 2 to 25 mm
Automatic focus:
Image rotation compensator
Dynamic focus:
Objective lens apertures: 50, 70, 70, 110 µm in Diameter
Stigmators
Wobbler
Specimen stage
Type: Fully eucentric goniometer stage
Specimen movement range
X-Direction: 0-50 mm
Y-Direction: 0-70 mm
Z-Direction: 2, 3, 6, 8, 15 and 25 mm (Step wise change)
Tilt: -5°C to 45°C
Rotation: 360°C Endless
Working distances: 2, 3, 6, 8, 15 and 25 mm
Electron detector system:
Detector
Photo multiplier voltage
Video amplifier control
Contrast control
Brightness control
Back scattered electron detector:
Imaging modes
Detector
Operation and display system
Image data processing system
Keyboard control
Photographic recording system
Scaler
Vacuum system
Safety devices
Cooling water:
Flow rate: 3 R. l/min or higher
Pressure: 0.05 to 0.25 MPa
Temperature: 20 ± 5°C
Faucet: 1, ISO 7/1 Rc 1/4 Coupling / 1, 14 mm 0.0. Nozzle
Drain: 1, ISO 711 Rc 1/4 Coupling / 1, Larger than 25 mm I.D. Nozzle
Sample size: Maximum, 4"
X-Direction: 50 mm
Y-Direction: 70 mm
Chamber:
Airlock, 4"
LN2 Cold trap, 4"
No EDX
Operating system: Windows 2000
Power supply: 200 V, 50/60 Hz, Single phase, 6 kVA
1998 vintage.
JEOL JSM 6340F is a state-of-the-art scanning electron microscope (SEM). It is equipped with a nano focused electron beam column and a wide variety of features for imaging, analysis, and material characterization. The SEM is designed to produce clear images of the surface of any sample, regardless of size or complexity. JEOL JSM-6340F is equipped with a LaB6 electron gun that produces electrons with high energy and low-divergence. This enables the exact focusing of the electron beam to create sharp images of even the smallest features. The instrument also comes with advance damping technology that reduces drift and vibrations during imaging, ensuring accuracy and eliminating artifacts. The SEM features a high-sensitivity scintillator and germanium lens that allow imaging at higher magnifications and resolutions. This allows for improved detection of composition and structural information. The microscope also features an indexing equipment for faster and easier operation. The always-on, automated alignment system guarantees reliable and repeatable alignment of the beam. This eliminates the need to manually adjust the beam, resulting in significant time savings and improved potential resolution. Other features of JSM 6340 F include a high-speed sample scanning unit, an automated control machine, and an integrated digital signal processor. The automated control tool maintains the exact temperature and humidity of the microscope chamber, creating a stable environment for operation. The integrated digital signal processor also allows efficient data processing and image resolution. JEOL JSM 6340 F is the ideal scanning electron microscope for applications requiring the highest accuracy and resolution. A wide range of options and functions make this state-of-the-art microscope suitable for almost any SEM imaging application.
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