Used JEOL JSM 6400F #136301 for sale

JEOL JSM 6400F is an advanced scanning electron microscope (SEM) that is used for a variety of research and manufacturing applications. It offers excellent resolution, features a beamoptic system with a Column Focus Alignment System (CFAS), and is capable of producing ultra-high resolution sample images. JEOL JSM 6400 F is equipped with secondary electron (SE), backscatter electron (BSE), and retractable X-ray analytical capabilities. It is capable of operating in environmental SEM (ESEM) mode and vacuum mode at a range of working pressure. The addition of an automated stage controller allows for automated alignment, coarse, and fine sample positioning adjustment. The electron source produces a 4.5 kV, 1.5 pA beam with a deflection range of 10.2 cm and a spot size of less than 5 μm. It features a column focus alignment system (CFAS) for providing high contrast imaging. The field emission gun (FEG) and energy dispersive spectroscopy (EDS) chamber provide optimal performance. The sample chamber is fitted with stage inserts to facilitate scanning of small area samples. The device has an image resolution of 0.9 nm and a contrast of nuclear size, enabling analysis of features on a wide range of materials down to atomic resolution. It can also be used to produce 3D samples. JSM 6400F is an highly customizable instrument and tools such as a pre-selection scheme, image shift correction and an automated focus example are available as optional features. The device is also capable of stacked imaging analysis and digital camera operation. It has a large screen with a 12.1 inch color touch panel that allows for perfecting data operation and display functions. In addition to its excellent imaging capabilities, JSM 6400 F provides comprehensive documentation and data analysis capabilities. The entire image capture and analysis process is automated, with a dedicated software package enabling users to make use of various image processing and analysis tools. For example, the ProSpec image capture and analysis package enables users to visualize, measure, and compare sample images.