Used JEOL JSM 6400F for sale
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Popular Product
JEOL
JSM 6400F
Scanning Electron Microscope (SEM) Field emission gun Resolution: 1.5 nm at 30 kV and at 8 mm WD Mag
65
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Popular Product
JEOL
JSM 6400F
Scanning Electron Microscope (SEM) Power supply: 208 V, 60 Hz, Single phase, 5 Amps 2002 vintage.
85
Popular Product
JEOL
JSM 6400F
Scanning Electron Microscope (SEM), parts system SEIKO SEIKI STP-300 Turbo pump.
83
