Used JEOL JSM 6400F #9210557 for sale

JEOL JSM 6400F is a scanning electron microscope (SEM) that is ideal for imaging and analysis of a wide range of samples due to its highly efficient schottky field emitter gun. Its high resolution and large depth of field capabilities make it capable of resolving both surface structures and internal features of samples. It has a high resolution area detector that is capable of imaging samples up to a low-kV range. JEOL JSM 6400 F utilizes a two-axis tilt holder in order to image samples at various angles in order to generate 3D-surface views of samples, as well as obtain views from the vertical direction and even horizontal directions. One of the incredible features of JSM 6400F is the sensing performance of its signal channel. This specific signal channel is backed up by an X-Y imaging system and advanced signal circuitry. These features allow for low voltage imaging and quick image display, which are both great for observation and analysis of biological and organic samples. This SEM is also equipped with a wide range of magnification capabilities up to a maximum of x400,000. In addition, this SEM has a robust environmental system which is able to maintain a constant microscope viewing chamber pressure of 3.2 to 5 torr, which is necessary for preventing electron-beam induced specimen charge accumulation. JSM 6400 F is also equipped with a computer controlled auto-stage, which is capable of automatically moving the sample stage after imaging to various positions for increased speed and accuracy. This SEM is also equipped with a bright field optics control function which can accurately adjust the brightness and contrast of an SEM image after the image is acquired. This feature enables the visualization and analysis of extremely weak signals, which is important for visualizing complex biological structures that are otherwise difficult to image. Finally, JEOL JSM 6400F also has various software packages for data collection and analysis which are user friendly and intuitive, allowing for great ease of use. While the magnification capabilities of JEOL JSM 6400 F is limited, the versatility and performance of this SEM firmly places it amongst the higher-end SEMs available. It is an incredibly powerful tool for imaging and analysis of a wide range of samples due to its enhanced resolution, tilt holder and computer controlled features.