Used JEOL JSM 6400F #9232673 for sale

ID: 9232673
Vintage: 2002
Scanning Electron Microscope (SEM) Power supply: 208 V, 60 Hz, Single phase, 5 Amps 2002 vintage.
JEOL JSM 6400F is a state-of-the-art scanning electron microscope (SEM) designed to provide high resolution imaging as well as a wide variety of analytical capabilities. It utilizes secondary electrons, backscattered electrons, and reflected electrons to create vivid, detailed images with deep depth of field. The instrument is equipped with a variety of specimen holders and stages to accommodate a variety of sample sizes and shapes. With a built-in ion gun and electron gun, JEOL JSM 6400 F is able to generate specimens with high surface quality allowing for accurate and precise imaging. The microscopes features a Field Emission Cold Cathode (FEG) gun that is capable of generating high electron beam current for increased brightness and imaging speed. Additionally, the Elite FEG powered by JEOL patented Ceta technology enables more accurate measurement of beam current, increased brightness, longer life, and narrower electron beams. This miniaturization of JEOL Elites FEG enables operation at lower currents and more precise control over specimen analysis. JSM 6400F is built with an intuitive user interface and an easy to configure software set up that quickly enables the user to customize the instrument settings. Additionally, this microscope features an automated stage and interchangeable lenses to ensure accurate and repeatable results. In terms of analytical capabilities, JSM 6400 F is capable of a variety of elemental mapping, chemical analysis, and energy dispersive spectroscopy (EDS). Its EDS capability is high resolution and accurate, with the ability to measure up to elements 5 with 1-3 keV resolution. Additionally, the microscope can be used for 3D imaging with its large depth of field and focused ion beam capabilities. Overall, JEOL JSM 6400F is a powerful, multi-purpose scanning electron microscope that is capable of producing detailed images and highly precise analysis. With its wide range of operational capabilities and sophisticated designs, this instrument is ideal for a wide variety of applications.
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