Used JEOL JSM 6400F #9253741 for sale

JEOL JSM 6400F is a high precision scanning electron microscope (SEM) that is used for imaging and analyzing the microscopic structure and composition of a wide variety of materials. This instrument is capable of imaging surface features as well as providing elemental analysis using energy dispersive X-ray spectrometry (EDS). JEOL JSM 6400 F offers a range of sophisticated imaging capabilities with automatic focus, a range of magnifications from 10X to 50,000X and a resolution of 1.0nm. Additionally, the 6400F has a newly designed low-vibration control system that makes is exceptionally stable when operating at high resolution. This instrument also has a signal detection range of 0.1 to 20,000 cps and can operate at two different electron voltage of 0.5 to 30kV, making it suitable for a wide range of materials and surfaces. Furthermore, the low noise digital preamplifier reduces image noise significantly, especially during EDS analysis. The backscattered electron detector also has a fast 50 second time response and can capture images without any artifacts due to beam penetration drift. JSM 6400F is equipped with an auto-stig and astigmator unit that minimizes the image distortions encountered in an SEM. This unit also allows for easy navigation of fields of view for both imaging and analysis. Additionally, a variety of analysis options are available including line scans, mapping, E-beam induced currents, and beam backscatter and threshold simulations. Finally, JSM 6400 F also has an automated analysis software that allows quick data analysis and reporting. Overall, JEOL JSM 6400F provides a powerful and precise scanning electron microscope for the analysis and imaging of a wide variety of materials.