Used JEOL JSM 6400F #9102730 for sale

JEOL JSM 6400F is a Field-Emission Scanning Electron Microscope (FESEM) which combines advanced features and small size to provide high-performance imaging, analysis, and measurement tools for a wide range of materials research applications. JEOL JSM 6400 F utilizes a unique field emission gun (FEG) that produces electrons with a beam spot size as small as one nanometer. This is combined with a unique triple gun design and advanced technologies to eliminate sample charging and surface effects. The monolithic workflow incorporates dual detectors for simultaneous imaging, allowing for high-resolution imaging, chemical analysis, and surface topography with unparalleled accuracy. The specimen chamber also provides vacuum levels as low as 1x10-6 Pa, making it ideal for studies of high resolution surface and optical phenomena. JSM 6400F provides key advantages in imaging, analysis and measurement performance. The high-resolution electron optics and pixel resolution of up to 8nm enable imaging of tiny features with unbeatable clarity. Scanning Auger microscopy (SAM) and X-ray energy dispersive spectrometry (EDS) capabilities allow chemical analysis of specimens with atomic-level accuracy. Advanced technologies including Wavelength-dispersive spectroscopy (WDS) and Electron Backscatter Diffraction (EBSD) enable 3D chemical and crystallographic imaging in nano areas. In addition, the low vacuum environment also ensures that no changes occur during the imaging process, allowing for reliable imaging over long-term experiments. JSM 6400 F features a user-friendly, intuitive software interface that allows efficient control over all operational parameters and system settings. This interface also allows for real-time data capture and integration with other analysis tools. The automated sample preparation tools help reduce the time spent on sample preparation, while the automated analysis tools enable the analysis of microscopy data with a few mouse clicks. JEOL JSM 6400F is an excellent choice for research and development in the fields of nanotechnology, materials science, semiconductor physics, and semiconductor devices.