Used JEOL JSM 6400F #293590368 for sale

JEOL JSM 6400F is a field emission scanning electron microscope (FE-SEM). It is a powerful tool for materials research and analysis, used for looking at features at the nanometer to micrometer scale. FE-SEM provides an extremely high intensity of electrons to the sample, making it particularly suitable for looking at low electron absorbent materials, such as certain semiconductors. JEOL JSM 6400 F uses a field emission gun (FEG) to achieve its high resolution imaging, which results in higher resolution images compared to conventional SEMs. The FEG also provides a lower accelerating voltage compared to other devices, making it ideal for imaging fragile samples. The 6400F additionally offers a range of analytical capabilities, allowing users to perform elemental analysis and chemical state mapping. It utilizes an ultra-high resolution energy dispersive X-ray (EDX) detector, which is capable of detecting elements at a resolution up to beryllium (Be). This enables the microscope JSM 6400F to detect the presence of impurities and other chemical states present in a sample. Additionally, the microscope's electron-beam induced current (EBIC) detector can be used to detect minority carriers within a sample. This makes it useful for tracing p-n junctions and other sub-micron features, such as electrical pathways and pathways. The 6400F also offers other features, such as a small sample stage and a wide range of both conventional and low vacuum modes. This ensures that it is suitable for a variety of applications, including transmission, reflection and backscatter imaging. JSM 6400 F is a versatile and powerful microscope designed for materials science applications. It offers the highest resolution of any SEM on the market and a range of advanced analytical capabilities. Ideal for imaging low absorption material and feature detection, the 6400F is sure to meet the demands of any materials science research project.