Used JEOL JSM 6400F #9065264 for sale

JEOL JSM 6400F is an advanced analytical and imaging Scanning Electron Microscope (SEM). JEOL JSM 6400 F offers ultra-high-resolution images for detailed examination of a wide range of samples. It features an ultra-wide field-of-view inclusive of a large sample chamber, making it ideal for research in the fields of biology, medicine, materials sciences and semiconductor industries. It is equipped with a high-performance electron column, advanced backscattered electron detector and flexibility that allows users to access a range of specialized techniques, including elemental mapping, 3D-reconstruction and biological imaging capabilities. The column of JSM 6400F consists of an ultra-high resolution (UHR) electron optics technology. This technology is designed to minimize aberration and maximize unobstructed field-of-view. It enables users to achieve higher resolution images than conventional SEM instruments. The integrated low-voltage capability of JSM 6400 F ensures stable imaging with lower accelerating voltages (<5kV) for delicate organic samples. JEOL JSM 6400F is also equipped with a backscattered electron (BSE) detector, providing a video contrast image with direct surface information. It significantly improves signal-to-noise ratio and makes sample ages quantitative over a broad range of samples. The integrated Low-vacuum system ensures sample stability by minimizing contamination and reduction in noise during long-time operation, from ultra high vacuum (UHV) to high vacuum (HV). In terms of flexibility, JEOL JSM 6400 F is able to access a range of specialized analytical and imaging techniques, such as 3D-reconstruction, biological imaging, spectral imaging and elemental mapping, making it suitable for numerous types of material characterization applications. Moreover, the included automated system allows users to capture high-resolution images quickly and conveniently. The scanning stage of JSM 6400F can be remotely controlled through an intuitive software interface, enabling users to control the size of analyzed areas and capture a broader field-of-view. In summary, JSM 6400 F is a versatile and powerful SEM for advanced imaging and analytical techniques. Its wide-field-of-view features, advanced electron column, and low accelerating voltage option make it suitable for applications in materials sciences, semiconductor industry, and biological and medical research. In addition, its flexibility and highly automated system make it a time-saving and efficient tool for detailed material and biological analysis.