Used JEOL JSM 6400F #9316404 for sale

JEOL JSM 6400F is a high performance scanning electron microscope (SEM) designed for a wide range of applications. The instrument features a large 200 mm stage for samples up to 6 kg and a large field of view of up to 300mm, providing superior sample manipulation and registration. The microscope also includes an energy dispersive spectrometer (EDS), which permits quantitative analysis on the sample. The EDS also has a continuous scanning mode, allowing the operator to analyze large area quickly and accurately. JEOL JSM 6400 F utilizes a high-resolution tungsten field emission filamentless electron source to obtain the best possible imaging resolution and image stability. The FEG source delivers a high brightness with improve resolution and contrast for all samples, and provides an extended operating range for ultra-high resolution imaging. Additionally, the FEG source emits a true low-angle illumination, a characteristic that further enhances the imaging quality and capacity of the instrument. JSM 6400F has a wide variety of sample holders compatible with the instrument's stage, which are designed to accommodate a range of sample sizes and shapes for accurate and consistent sample placement. The stage offers robust mechanical stability and is equipped with an auto sample exchange capability which allows for sample exchange without breaking vacuum. The automated exchange capability also enables versatile operation in low-vacuum mode for ultimate sample protection. JSM 6400 F includes a wide range of imaging modes, including low-voltage scanning electron microscopy, with both inlens and in-bottom detectors, for optimum sample characterization. In addition to brightfield and darkfield imaging, users can also record backscattered and secondary electrons from the same specimen field, for capture of all three signal components. The instrument is also equipped with digital imaging and automation capabilities, which allow the user to access and analyze their images from any location. JEOL JSM 6400F features a large sample exchange area and rapid acquisition speeds, making it ideal for rapid sample scans, and its modular design simplifies maintenance. The instrument is also equipped with an intuitive user interface that allows users to quickly work up and interpret data. The user interface also includes extensive safety features that are designed to ensure safe operation.