Used JEOL JSM 6400F #293595853 for sale
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ID: 293595853
Vintage: 2001
Scanning Electron Microscope (SEM)
Field emission gun
Resolution: 1.5 nm at 30 kV and at 8 mm WD
Magnification: 10x to 500000x
Probe current: 10 x 10-12 A to 10 x 10-10 A
Electron gun: Cold cathode field emission
Detectors: Scinitillator / Photomultiplier
GW Electronic system 47 Backscattered detector
Specimen stage: Fully eucentric goniometer stage
Tilt: -5° to 60°
Rotation: 360°
Movements:
X = 100 mm
Y = 110 mm
Z = 34 mm
Specimen exchanger:
Specimen holder airlock, 6"
Larger specimen holder drawout, 8"
EDS Detector: Prism 2000 Si(Li) 30 mm
Imix acquisition system allowing be detection
EBSD Detector: OXFORD HKL Allowing crystallographic orientation
Accelerating Voltage: 500 V to 30 kV
2001 vintage.
JEOL JSM 6400F scanning electron microscope is a state-of-the-art instrument used for the observation and analysis of a wide range of samples. It is capable of generating high-resolution images of biological, industrial and other materials. The instrument is equipped with a high-speed motorscan, a special high vacuum equipment, a digital image processing system, and an interactive user interface. JEOL JSM 6400 F is equipped with a field emission gun (FEG) electron source, which utilizes thermionc electron emission from a heated tungsten filament. This electron source produces a finely focused probe of very high brightness which is used to generate micrographs in the scanning electron microscope. The gun is capable of a range of magnifications from 5 to 150 kV, and can be used for high resolution imaging with a resolution as fine as 0.3nm. JSM 6400F also features a high-speed motorscan which makes it possible to quickly capture images with consistent resolution. The motorscan technology allows for highly accurate automated scanning across the specimen surface, with image acquisition times as fast as 0.5 milliseconds. To ensure the highest resolution images, the instrument is equipped with a special high vacuum unit. This machine creates a high-vacuum environment in which the electrons used to generate the images of the sample don't suffer any collisions with air molecules. To further ensure high quality of the images, JSM 6400 F also features a thermionic emitter assembly with spatial resolution of less than 1 mm. Additionally, the instrument comprises a digital image processing tool. This asset includes a computer and a monitor with an interactive user interface. This interface allows for users to change the size and magnification of the images, as well as to adjust the brightness and contrast during image acquisition. In summary, JEOL JSM 6400F is an advanced scanning electron microscope equipped with a field emission gun, a high-speed motorscan, a special high vacuum model, a thermionic emitter assembly, and a digital image processing equipment with an interactive user interface. This sophisticated instrument is capable if producing sharp, high resolution images with speeds that enable users to observe dynamic events.
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