Used JEOL JSM 6400F #9080576 for sale

JEOL JSM 6400F is a Scanning Electron Microscope (SEM) which is capable of providing incredibly high resolution imaging and analysis of a variety of sample types at very low accelerating voltages. Its features make it an excellent choice for many applications, including material characterization, failure analysis, and imaging of devices and nanostructures. JEOL JSM 6400 F has a unique and ergonomic design which gives users access to three different operational modes. These modes include Low-Voltage mode, which enables imaging of non-conductive materials or semiconductor devices, High-Voltage mode, which is ideal for viewing thicker, conductive samples such as metallic materials and polymers, and a Focus and Analyze mode which allows features to be magnified up to 20,000x with a resolution of 0.7 nanometers. JSM 6400F is also equipped with a robust selection of additional features. These features include an ultra-high resolution optical detector, an automated sample loader, automated beam alignment, a built-in field emission source, an integrated low-vacuum system, and an auto-focus system. JSM 6400 F also offers several different analysis capabilities for more advanced applications. These options include Electron Probe Microanalysis (EPMA), Energy Dispersive X-Ray Spectroscopy (EDXS) and Scanning Electron Microscopy (SEM). The advanced features of JEOL JSM 6400F make it an ideal choice for many different applications. Its easy-to-use and efficient design allows users to quickly load samples, adjust the beam for optimal results, and obtain a variety of different images in one sitting, making it one of the best SEMs available today.