Used JEOL JSM 6400F #9089825 for sale

JEOL JSM 6400F is a high-performance Field Emission Scanning Electron Microscope (FE-SEM) designed to provide groundbreaking imaging and analytical capabilities for both research and industrial applications. Its highly efficient design offers top-notch performance, allowing it to achieve significantly higher resolution, higher magnification, reduced noise and faster imaging speeds than traditional SEMs. JEOL JSM 6400 F features a field-emission gun (FEG), which offers superior resolution and image resolution compared to standard Schottky or tungsten field emission sources. The FEG is capable of producing a range of primary electron energies between 0.2 to 30 KeV. This enables a greater range of imaging capabilities and improved ability to detect and identify subtle features of specimens. The 6400F also features a large depth of field and rapid scan speed, allowing for accurate, high-resolution imaging and data acquisition even when changing the focus from near-surface to sub-surface features. JSM 6400F is equipped with a high-performance and spatially uniform electron lens system, which utilizes in-lens and post-lens condenser lenses optimized for optimal aberration correction and resolution. Additionally, it is equipped with the latest image pre-processing technology to provide the best available imaging. JSM 6400 F also features a wide variety of analytical and imaging functions, including Energy Dispersive Spectroscopy (EDS), Wavelength Dispersive Spectroscopy (WDS), Electron Backscatter Diffraction (EBSD), Cathodoluminescence (CL) and Dual-beam focused ion beam (FIB). These state-of-the-art capabilities make JEOL JSM 6400F an invaluable tool for analytical and imaging techniques. JEOL JSM 6400 F also offers a wide range of software features to support efficient and effective operation. These include an automated specimen stage control system, advanced tools for managing specimen scans and an intuitive user interface for efficient operation. JSM 6400F is a powerful and versatile instrument for imaging and microanalysis, with an extensive range of capabilities and features tailored to meet the demands of today's research and industrial nanotechnology applications.