Used JEOL JSM 6400F #9119070 for sale

JEOL JSM 6400F is a highly advanced scanning electron microscope capable of producing images with a resolution of up to 0.1 nanometers. It utilizes a unique combination of 3D scanning and energy-dispersive X-ray spectroscopy in order to produce incredibly detailed images of the surface and subsurface of materials. It is equipped with several automated features, including a tilting stage that enables 3-dimensional imaging, a fully automated stigmator, and a high-current electron emitter and deceleration-aberration corrector. This makes the instrument particularly well-suited for atomic resolution imaging, allowing for the imaging of highly detailed structures such as individual atoms and molecules. The 6400F also features a large, 4K pixel image capture system, designed to allow for the highest resolution images possible. The microscope utilizes an automated vacuum system which ensures a consistent level of vacuum during operation, and a low background noise imaging signal combined with a highly sensitive digital signal processing algorithm to ensure exact image clarity. This allows for the capture of delicate sample images without the need for any manual intervention. JEOL JSM 6400 F is an incredibly powerful instrument that can be applied to a number of different research applications. It is an invaluable tool for biological and materials research, due to its outstanding imaging capabilities. It can be used to image individual cell components, such as proteins and virus particles, as well as microstructures on the surface of almost any material. Additionally, the microscope can be used in the fields of nanotechnology and electronics to help enhance circuit board and integrated circuit design. In summary, JSM 6400F is a highly advanced scanning electron microscope with a wide array of features designed to ensure precise images with a resolution of up to 0.1 nanometers. It is an invaluable tool for both biological and materials research, and can be used to gain insight into complex structural features of almost any material. With its automated features, advanced imaging capabilities and intricate digital signal processing algorithm, JSM 6400 F is a powerful and versatile instrument that can be applied to a vast number of research applications.