Used JEOL JSM 6400F #9236172 for sale

JEOL JSM 6400F is a scanning electron microscope (SEM) used for imaging and analyzing specimens at high resolutions. Its unique features and capabilities make it suitable for a variety of research applications, including material science, micro-fabrication, nanotech, medicine and forensic science. JEOL JSM 6400 F uses a high-resolution zeolite-coated field emission gun (FEG) and uses an acceleration voltage of 0.15 kV to 30 kV. With this dynamic range, researchers can characterize samples ranging from non-conductive materials to highly conductive samples. The microscope can run in either SE or BSE imaging modes, and the microprocessor-controlled sample leveling equipment ensures precise imaging. JSM 6400F also has a unique digital image processing system, which can be used to optimize imaging conditions and enhance contrast. There is also a digital camera with three RGB LED backlights, which allows users to capture images with a color range of up to 24.5 million colors. The microscope also utilizes a stage scanning unit powered by an auto-focus machine, allowing for ultra-small sample sizes of up to 30 nm. The advanced electron optics of JSM 6400 F allow for higher resolutions than achievable with optical microscopes. Resolution can be further enhanced by using the optional in-lens detectors. Additionally, time-resolved spectra analysis is possible using the built-in time-resolved EELS and EDX systems. The built-in software allows users to quickly analyze their data and generate 3D reconstructions. JEOL JSM 6400F is also equipped with a powerful software package, including features such as automated sample navigation and auto-acquisition. These features make it easier and faster to image and analyze samples. The microscope is also compatible with a wide range of accessories and devices, allowing users to expand its capabilities even further. Overall, JEOL JSM 6400 F is an advanced, high-performance scanning electron microscope that provides excellent resolution and contrast, enabling researchers to image and analyze a variety of material quickly and efficiently.