Used JEOL JSM 6490LV #293594823 for sale
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ID: 293594823
Scanning Electron Microscope (SEM)
Magnification: 8x to 300,000x
Image mode: SEI, BEI, Low vacuum BEI
Probe current: 1 pA to 1 µA
Low vacuum mode resolution (BEI): 4 nm at ACC 30 kV, WD: 5 mm
Pressure: 10 Pa to 270 Pa
Lowest pressure: 1 Pa
Image mode: BEI-Composition-topography
No DP
Lens: Electromagnetic 2-stage zoom condensor
Lens type: Objective lens (Supper conical mini lens)
Dynamic focus: Linked to AccV and magnification auto focus tracer
Wobbler
Automatic focusing (AFD)
Specimen stage type: Eucentric
Maximum acceleration voltage: 30 kV
Vacuum pump:
Primary: Turbo pump
Secondary: Rotary pump
Resolution:
3 nm at ACC 30 kV, WD: 8 mm, SEI
8 nm at ACC 3 kV, WD: 6 mm, SEI
15 nm at ACC 1 kV, WD: 6mm, SEI
Full automatic stage (X, Y, Z, R, T):
X: 125 mm
Y: 100 mm
Z: WD: 5 mm to 48 mm
Tilt: -10° to 90°
Rotation: 360° (Endless)
Operating system: Windows 7.
JEOL JSM 6490LV is a scanning electron microscope (SEM) known for its superior image resolution, high resolution imaging (HRI), and long service life. It uses an electron beam to acquire images of specimens. This SEM is completely automated, with a fully integrated specimen stage, an integrated dual detector system, and vacuum system. JEOL JSM-6490LV is an SEM that provides a resolution of up to 1 nm, and is capable of producing three-dimensional images at magnifications up to 100,000x. It is optimized for imaging thin-film materials, metals, and other materials that require high-resolution imaging. The precise beam control and advanced imaging capabilities, combined with its automated features, make JSM 6490LV an ideal tool for materials characterizations, failure analysis, and research applications. The dual detectors of JSM-6490LV provide superior sensitivity and detection of secondary electrons, back-scattered electrons, and X-ray signals. The detectors collect signals from a range of angles and provide a full accommodation of specimens that require complicated alignment and multi-directional imaging. The images produced by JEOL JSM 6490LV offer excellent contrast and precise detail, making it an ideal instrument for defect analysis. JEOL JSM-6490LV has a fully automated specimen stage that can be programmed for linear and angular motions with a resolution of 0.1 μm (10 nm). This allows the user to reposition the specimen quickly and accurately, resulting in improved imaging and analysis. The advanced specimen navigation and position control ensure that the correct settings are always used on the same sample each time it is imaged. The specimen stage is also equipped with environmental control and anti-vibration options, minimizing any motion distortion during imaging. JSM 6490LV scanning electron microscope provides a capable imaging solution for a broad range of materials characterization applications. It is an ideal instrument for failure analysis, nanoscale imaging, and research. Its superior resolution, automated features, and advanced dual detectors make it an excellent choice for laboratory settings that require precise and detailed imaging results.
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