Used JEOL JSM 6490LV for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 6490LV

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Scanning Electron Microscope (SEM) Infrared camera Detectors: Secondary Electron (SE) Backscattered

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Scanning Electron Microscope (SEM) Resolution: 3.0 nm Includes: (2) CPU (3) APC Back-ups KEITHLEY 4

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Scanning Electron Microscope (SEM) Low vacuum mode High resolution: 3.0 nm With motor stage Asynchro

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Scanning Electron Microscope (SEM) Magnification: 8x to 300,000x Image mode: SEI, BEI, Low vacuum BE