Used JEOL JSM 6490LV for sale
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JEOL
JSM 6490LV
Scanning Electron Microscope (SEM) Infrared camera Detectors: Secondary Electron (SE) Backscattered
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JEOL
JSM 6490LV
Scanning Electron Microscope (SEM) Resolution: 3.0 nm Includes: (2) CPU (3) APC Back-ups KEITHLEY 4
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