Used JEOL JSM 6490LV #9229495 for sale

JEOL JSM 6490LV scanning electron microscope (SEM) is a highly advanced instrument for imaging and analysis of the three-dimensional structure of a wide range of materials. Its state-of-the-art design features a large 5-axis stage capable of precise motion control, allowing for scanning large areas with fast speeds. This makes the 6490LV ideal for conducting general material investigations and analysis. The 6490LV features an electron column with a high electron field emission and a large field emission gun (FEG) source of 40,000 to 90,000V. The electron optics includes a scanning coil condenser system providing a variety of condenser settings for optimum imaging conditions and magnifications from 10x up to 15,000x. A wide selectable working distance of 18-60mm is available for operation of multiple accessories, such as detectors, lenses, and sample holders. The 6490LV is equipped with a variety of detectors, allowing for simultaneous imaging of many types of signal information. This includes a 6k x 8k pixel resolution backscatter detector to acquire high-resolution SE (secondary electron) images. It also includes a high-resolution SE1 detector, high-sensitivity BSE (backscattered electron) detector, and optional EBSD (electron backscatter diffraction) detector for microstructural characterization. The powerful X-ray detector enables the 6490LV to generate X-ray maps and profile maps for chemical analysis. It includes four sets of detectors; a scintillation detector, an energy dispersive X-ray spectrometer (EDS) detector, a radio-permeate detector, and a wavelength dispersive X-ray spectrometer (WDX). The EDS and WDX detectors can analyze elemental composition in high resolution and precision. The 6490LV is designed with user convenience in mind. Color touch-screen panels provide easy control of the SE/BSE detectors, voltage adjustment, stage setting, and acquisition of data. A built-in design flexibility feature allows users to quickly switch between environmental and analytical modes. In conclusion, JEOL JSM-6490LV scanning electron microscope is an advanced and versatile instrument capable of imaging and analysis of a wide range of materials. Its outstanding electron optics, selectable sample stages, and array of detectors provide users with an extensive range of capabilities, making it an ideal choice for research and analysis.