Used JEOL JSM 6490LV #9278879 for sale

JEOL JSM 6490LV is a high-precision scanning electron microscope (SEM) used in research laboratories and educational institutions. It provides a wide range of options for magnifications, resolutions, and electron beams that allow for imaging of micro- and nanoscale materials with superior quality. JEOL JSM-6490LV provides excellent resolution, with the ability to image materials up to a magnification of 100,000x. It is equipped with a LaB6 high-tension electron source, providing a stable and clean electron beam. The source provides extremely low noise levels, and is capable of sub-micron electron beam stabilities for precise beam manipulation. JSM 6490LV has a sample chamber which is designed for easy installation and removal of samples. With a clear viewfinder, it is easy to quickly examine samples, and the included LED sample illumination makes it easy to recognize and locate samples. The SEM is also equipped with an auto focus technology that allows automatic focusing and scanning of objects in the chamber. In addition, JSM-6490LV features an advanced two-axis sample stage with a large sample capacity of up to 300 x 300mm. It is also equipped with an ultra-precision motorized movement system which provides accuracy, stability, and repeatability. The SEM is also capable of acquiring images in various modes including SEM, EDS, CL, and stereoscopic images. Finally, JEOL JSM 6490LV also has an advanced screening and filtering system which improves the accuracy of the instrument when imaging a variety of materials. It has both digital and analog signal outputs, and is equipped with built-in software for controlling the electron optics and sample analysis. With its robust design and advanced capabilities, JEOL JSM-6490LV is an ideal instrument for a range of materials science research and development applications.