Used JEOL JSM 6490LV #293800978 for sale

JEOL JSM 6490LV is a scanning electron microscope (SEM) designed for use in a variety of research and industry applications. In order to enable accurate imaging of specimens, the microscope utilizes both secondary electrons (SEs) and backscattered electrons (BSEs). JEOL JSM-6490LV is equipped with a high-resolution and high-magnification field emission gun (FEG) electron gun, which allows for a maximum acceleration voltage of 30 kV as well as a high-resolution SE/BSE detector that provides a resolution of up to 1.3 nm. Unique to this microscope is its low-vacuum operating mode, which is ideal for non-conducting specimens or when observation of low-kV electrons are desired. This microscope is equipped with a robust automated microscope body drive system and a large-diameter high-performance objective lens. As a result, it is capable of high resolution imaging for samples up to 200mm in height as well as an aperture angle of up to 60°. Additionally, JSM 6490LV offers an optional 5:1 field of view range, which increases the system's capability for observing large specimens. The imaging capabilities of this SEM extend beyond the typical imaging of surface properties. Equipped with an energy-dispersive X-ray (EDX) detector, this microscope is capable of chemical, structural and quantitative elemental analysis for elements from beryllium to uranium. This EDX detector is capable of acquiring data within a few seconds and performing detailed analyses, allowing users to gather a wealth of information about their sample. This microscope's high resolution, versatility and automated scan control also makes it ideal for 3D reconstruction and tomography imaging, allowing observations of specimen features in all directions. In conclusion, JSM-6490LV provides researchers with a powerful and versatile imaging tool capable of accurately imaging both low- and high-force samples in a variety of research and industrial applications. Its combination of electron gun, detector and automated scan control provide a comprehensive system for imaging and analyzing a wide range of samples, with the added benefit of being able to perform many of these analyses within moments.