Used JEOL JSM 6490LV #9213891 for sale

JEOL JSM 6490LV Scanning Electron Microscope (SEM) is a versatile, powerful instrument for high resolution imaging and analysis. This instrument has a wide range of sample holders for environmental scanning electron microscopy (ESEM), allowing for analysis of samples in a variety of environments including humid, vacuum, and low/high temperature. The maximum magnification that can be achieved with the SEM is 100,000x, and both secondary and backscattered electron detectors can be used in imaging and elemental analysis. The SEM has an operating voltage range of 1 - 30kV, allowing for fine control of acceleration voltage to ensure proper sample milling and resolution of delicate surfaces. The fine control is especially helpful in imaging features less than 0.5nm in size. Sensitivity for X-Ray analysis is also possible with JEOL JSM-6490LV, allowing for easy quantification of minor and trace elements present in specimens. The SEM has an automated stage for imaging large specimens and can scan up to 100mm in diameter. JSM 6490LV also possesses a linear detector, allowing easy imaging of line-scan samples. In addition, automated navigation and imaging provides speedy image acquisition. The JSM 6490L comes in two basic packages, the standard version and the ESEM package. The standard version is for those who don't need the capabilities of the environment scanning chamber. The ESEM package includes an environment scanning chamber for low and high temperature, water, and gas analyses. JSM-6490LV SEM is an extremely versatile and powerful instrument that can be used in a variety of applications. Its user-friendly design, variable voltage range, automated navigation, and elemental analysis capabilities make it an invaluable tool for any lab. With its ability to image delicate surfaces with the highest resolution, it can provide fascinating and detailed data that would otherwise be inaccessible in a more traditional SEM.