Used JEOL JSM 6490LV #9293317 for sale
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ID: 9293317
Scanning Electron Microscope (SEM)
EDAX Octane 9 Energy Dispersive Spectrometer (EDS)
Operating system: Windows 10
DENTON VACUUM Desk V Sputter coater
With specimen holders and accessories
Electron gun
Pre-centered tungsten
Accelerating voltage: 0.3 Volts to 30 kV
High vacuum resolution: 3 nm at 30 kV
Low vacuum resolution: 4 nm at 30 kV
Magnification: 5x - 300,000x Secondary electron image
Auto-focus
Auto-stigmator
Auto-gun (Saturation, Bias and Alignment)
Auto-contrast
Auto-brightness
Continuous auto bias
With fine X/Y controllable directions
Diffusion pumped specimen chamber
Specimen stage
Motions:
X: 125 mm
Y: 100 mm
Z: 5 mm to 80 mm
Tilt: -10° to +90°
Rotation: 360° Continuous
Full coverage: 32 mm
Maximum specimen size, 8”
Coverage specimen loadable, 12”
Super conical objective lens
(3) Objective final lens apertures
High resolution LCD monitor, 20"
BSE Detector.
JEOL JSM 6490LV is a state-of-the-art scanning electron microscope (SEM). It is based on a dual beam technology platform consisting of an electron gun, a column, and a variety of detectors. The electron gun is a thermal arc cathode capable of emitting electrons with a landing energy of 0.5 keV and maximum power at 25 keV. The column, which directs the electron beam, is a 100 kV variable stage with a maximum acceleration voltage of 30 kV. The unique low voltage feature of this column enables the highest resolution imaging for samples, while allowing for the greatest flexibility when it comes to images. JEOL JSM-6490LV also features a wide range of imaging capabilities, such as secondary and backscattering images for standard SEM applications as well as advanced applications like wavelength dispersive spectrometry (WDS), energy-dispersive spectrometry (EDS), and electron microprobe analysis (EPMA). With EDS, the user can obtain elemental information from samples by detecting X-rays emitted from the sample when it is bombarded with an electron beam. JSM 6490LV comes equipped with a fully motorized sample stage, a motorized mini SEM stage, and a motorized XYZ stage. With a variety of objective lenses to choose from, the user can observe samples with magnification from 10x to 700,000x. It also includes an automated pixel size adjustment system for improved image resolution. A vacuum pump is included with the system to ensure that the sample chamber is always maintained in a state of high vacuum. This allows for high-resolution imaging and spectroscopy experiments to take place with minimal sample disturbance. JSM-6490LV can also be manipulated with a variety of manipulators, such as an electrostatic lens turret, aperture, magnification, and deflection, which enables fine positional control of the electron beam. Overall, JEOL JSM 6490LV is a powerful scanning electron microscope designed for high-precision, ultra-high resolution imaging and spectroscopy applications. It features a versatile dual beam design, a variety of powerful detectors, a fully motorized sample stage, a range of objective lenses, and a vacuum pump for efficient sample processing. The integrated software makes it easy to use and offers a wide range of settings to customize the imaging or spectroscopic performance to the user's exact needs.
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