Used JEOL JSM 7400F #188813 for sale

JEOL JSM 7400F is a field emission scanning electron microscope designed for both ultra-high resolution imaging and advanced nanoscale analytical applications. JSM 7400F enables imaging and analysis of samples with resolutions down to 1nm on the surface of complex structures. The field emission source on this microscope allows for excellent image quality and increases the attainable current density. Its improved cathode current supplying system allows for operation of several emission sources simultaneously, contributing to increased overall performance. The microscope also offers a large set of secondary guns and detectors enabling highly selective approaches for imaging and analysis. These include an in-column dual-axis Energy Filter and an in-lens single-axis Low-Vacuum Energy Filter (LVEF). JEOL JSM 7400F also offers a large set of additional features for advanced analysis. Its high-performance EDX (Energy-Dispersive X-ray) and WDX (Wavelength-Dispersive X-ray) spectrometers make it possible to acquire both qualitative and quantitative elemental analysis. Beyond that, JSM 7400F comes equipped with a Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS), which is utilized to analyze adatom and surface structure features, as well as to perform depth profiling of the sample. JEOL JSM 7400F offers a versatile set of software features. Shimadzu EPMA Viewer software can be used to measure X-ray images, and FST Mapping to focus on specific ranges of energy. In addition, EPMA-capable auto scan software can be optionally used to automate the imaging and analysis process with additional simulations. All in all, JSM 7400F is an advanced scanning electron microscope offering high-resolution imaging, advanced nanoscale analytical capabilities, and a wide range of additional features, making it a great choice for users looking for a versatile and powerful SEM.