Used JEOL JSM 7400F for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 7400F

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Scanning Electron Microscope (SEM) Operating system: Windows 2000 Source type: TFE Primary pump: ODP

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Field Emission Scanning Electron Microscope (FE-SEM) In-lens SE detector In-lens BSE detector NORAN

Field Emission Scanning Electron Microscope (FE-SEM) Orion image system SEIKO Turbo pump Manual 2004