Used JEOL JSM 7400F #9272205 for sale

JEOL JSM 7400F is a state-of-the-art scanning electron microscope (SEM) often used in a variety of applications including materials and surface science. It offers superior functionality and usability with a wide range of features including high resolution imaging, elemental microanalysis, and 3D topographical reconstructions. At the heart of JSM 7400F lies an electromagnetically perpendicular field lens equipment affording both high resolution imaging down to 0.5 nm lateral resolution and enhanced depth of field capability. This system works in tandem with a high resolution secondary electron detector for optimal imaging of samples. Coupled to the lens unit is a versatile X-ray microanalysis machine. This tool enables users to perform non-destructive elemental analysis of samples over a wide range of energies from beryllium to uranium (B-U). JEOL JSM 7400F further utilizes an environmental field emission gun with a high current density and superior stability, providing pristine image-forming electrons. This rifle is excellent for high contrast imaging, making it ideal for imaging and analyzing samples such as insulating materials. In addition, the unit has a range of accessories such as a broad range of vacuum pressure options, several objective lenses, along with a range of additional detectors for EDX, WDX, BSD, and other analyses. Finally, JSM 7400F utilizes 3D imaging technology for topographical imaging of samples. This technology allows users to create 3D reconstructions from 2D images, enabling accurate understanding of surface geometry and morphologies. The 3D imaging asset can be combined with high resolution electropolishing for specimen preparation in order to obtain high-resolution images with superior surface detail. In conclusion, JEOL JSM 7400F is a powerful scanning electron microscope for sample analysis and imaging. It has a range of features including high resolution imaging, elemental microanalysis, and 3D topographical reconstructions for detailed analysis of materials and surfaces. Through its advanced features and versatile design, JSM 7400F is an excellent tool for research in a variety of fields.