Used JEOL JSM 7400F #9384379 for sale

Name: JEOL JSM 7400F
Brand: JEOL
SKU: 9384379
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 7400F

ID: 9384379

Field Emission Scanning Electron Microscope (FE-SEM) In-lens SE detector In-lens BSE detector NORAN Vantage EDS detector Secondary electron image resolution: 1.0 nm (Acc V 15 kV) 1.5 nm (Acc V 1 kV) Accelerating voltage: 1 to 2.9 kV (10 V Steps) 3 to 30 kV (100 V Steps) Magnification: x25 to 650,000 Imaging modes: Secondary Electron Image (SEI) Lower Secondary Electron Image (LEI) Specimen stage: Eucentric Type I X: 70 mm Y: 50 mm Z: 23.5 mm (WD 1.5 to 25 mm) Tilt: -5° to 70° Rotation: 360° Maximum specimen size: 204 nm Diameter x 10 mm Height Auto functions: Auto Focus (AFD) Auto Contrast and Brightness control (ACB) AFD+ACB Auto photo.

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JEOL JSM 7400F is a field emission scanning electron microscope (FESEM) designed for a range of applications in material science and biological research. JSM 7400F is an advanced FESEM featuring an integrated Ultra High Vacuum (UHV) equipment and a high resolution, energy-dispersive X-ray detector for precise elemental analysis. The microscope's electron source is a lanthanum hexaboride field emission gun (FEG), which provides high resolution imaging and reduces operating costs. The FEG is powered by an active variable electron gun control (VEGC) system, which precisely controls the voltage, current, and gun angularity for optimal performance. The powerful, high-resolution electrostatic lenses are equipped with variable condenser apertures and field diaphragms for precise image control. JEOL JSM 7400F is designed for an extremely high signal-to-noise ratio, offering unprecedented imaging speed and sensitivity. It also offers a built-in low vacuum mode of operation, allowing integration with electrically and mechanically sensitive samples. An energy filter provides resolution to within 0.9 eV, while the in-column sample chamber accommodates a wide range of samples, from the smallest to the heaviest materials, including biological specimens. The microscope is a precise analytical instrument, providing accurate and reliable measurements with the advanced X-ray detectors. The energy-dispersive spectroscopy (EDS) unit allows for identification of the chemical composition of samples. The integrated wavelength-dispersive spectroscopy (WDS) machine further enhances elemental mapping capabilities with high sensitivity and excellent precision. JSM 7400F is capable of operating in a range of temperatures, from room temperature (20°C) up to 300°C. It features conventional and in-lens detectors, and the large specimen chamber enables simultaneous imaging with multiple detectors. The user-friendly design of JEOL JSM 7400F also includes a well-organized user interface and navigation console, allowing for ease of use and precise control. JSM 7400F is an advanced, high-performance field emission scanning electron microscope designed for versatile analysis and imaging of a range of materials and biological specimens. It provides excellent imaging resolution, a wide sample chamber, and reliable, accurate tests with its advanced FEG and X-ray detectors. The convenient user interface and precision analytical capabilities of JEOL JSM 7400F make it a reliable, cutting-edge choice for today's scientific research.