Used JEOL JSM 7400F #9244470 for sale
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ID: 9244470
Cold cathode Field Emission Scanning Electron Microscope (FE-SEM)
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Operating system: Windows 7.
JEOL JSM 7400F is a high-performance, next-generation scanning electron microscope (SEM) for imaging and analysis in a wide range of materials sciences. It has a highly reliable and versatile design, with a number of advanced features. At the core of JSM 7400F is the electron beam column, which employs a Schottky field emission gun (FEG) to create a highly stable electron beam. The column is driven by two independent scanning coils, allowing for fine control of the electron beam position and convergence. The column also has a built-in high tension source that can be used to generate various imaging modes, including secondary electrons (SE) and backscattered electrons (BSE), which can be used to generate contrast on screen. This is further enhanced by the micron level resolution available across samples. The control module of JEOL JSM 7400F has powerful software for easy control and automation of sample positioning and parameter setting. Its interactive graphic user interface makes it easy to configure specialized imaging tasks, with a convenient touchpad used to control the use of multiple imaging and analysis packages available on the instrument. Some of these packages include energy-dispersive x-ray spectroscopy (EDX), x-ray mapping, and electron backscatter diffraction (EBSD). The 7400F also comes with automated calibration features, designed to ensure precise specimen centering and scanning accuracy. One of the main features of JSM 7400F is its efficiency, due to the highly efficient filtering and cooling features that reduce the use of energy. Additionally, it is equipped with air-ventilated LEDs and a closed-loop electrical grounding system that ensure a very low level of noise. The instrument's safety features include an emergency stop button and laser safety interlocks, which provide instant safety shutoff in the event of an interruption in the operation. JEOL JSM 7400F is an ideal instrument for a wide range of applications, from material sciences research to industrial failure analysis. Its combination of advanced features, ergonomic design, and high performance provides researchers and technicians with a reliable, powerful imaging and analysis tool.
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