Used JEOL JSM 7401F #293750575 for sale

JEOL JSM 7401F is a scanning electron microscope (SEM) well-equipped for high-resolution sample imaging and analysis. Boasting a maximum magnification of up to 400,000X, this instrument is a powerful tool for resolving microscopic structures of many different types of materials. JEOL JSM-7401F offers high quality imaging with ultra-high vacuum and low-vacuum modes, allowing it to produce highly detailed images and spectroscopic data of both organic and inorganic samples. The SEM features a field emission gun electron source, which coupled with its FEG lens enhances the quality of images and reduces the cost per scan. With a large stage this instrument is ideal for imaging large sample areas and for rapid sample scanning. It has several imaging modes, including secondary electron imaging, backscattered electron imaging, and even cathodoluminescence imaging. The SEM is also capable of performing wavelength dispersive spectroscopy (WDS) and energy dispersive spectroscopy (EDS) depending on the needs of the user. In addition to its imaging capabilities, the SEM also has a navigation system that allows the user to quickly navigate large sample area. This navigation system can help in finding various areas of interest such as flaws, defects, or even the presence of particular elements in the sample. The instrument also allows users to easily store and evaluate their imaging results in a variety of formats, allowing for easier data comparison over multiple scans of the same samples. The sem features an on-board PC with a large memory capacity that allows for easy data management and sorting. Furthermore, the instrument is also compatible with Windows OS for more advanced data manipulation capabilities. In summary, JSM 7401 F is a highly advanced and powerful scanning electron microscope suited for imaging many different types of samples. With advanced imaging capabilities, a large stage, high quality image resolution, and excellent data management options, this instrument is ideal for resolving microscopic features at the highest available magnifications.