Used JEOL JSM 7401F for sale

Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 7401F

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Field Emission Gun Scanning Electron Microscope (FEG-SEM) Does not include EDS 2005 vintage.

414

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Scanning Electron Microscope (SEM).

192

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Scanning Electron Microscope (SEM) SM 34080 Lower detector device SM 36120 In-column faraday cup SM

363

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Scanning Electron Microscope (SEM) Usage time: 20 years No EDS No BSE detector Infrared camera.

239