Used JEOL JSM 7401F #293770674 for sale

JEOL JSM 7401F is a scanning electron microscope (SEM) commonly used in applied research. It is renowned for its high-quality imaging, precise sample analysis, and accurate measurements. This scanning electron microscope stands out due its high resolution and allows for magnifications up to 200,000x. JEOL JSM-7401F incorporates features such as a field emission gun (FEG) for high accelerating voltage that produces a stable beam, allowing for accurate imaging and analysis. It also contains two detectors - the secondary electron detector and the backscattered electron detector - that measure the interaction between the electron beam and the sample. This is known as analytical imaging and is a powerful tool for in-depth research. JSM 7401 F uses an X-ray Detector for spectrometry, a technique used for elemental analysis. This helps identify elements in the sample and determine atomic composition. X-ray Detector also allows for X-ray line scanning, spot analysis, and EDX mapping - all used to visualize chemical distributions. For high speed image capture, JEOL JSM-7401 F contains several image capture components. It is equipped with a high-resolution CCD camera that produces digital images with minimal noise. The "High Defocus" feature enhances image quality at higher magnifications and rapid-scanning techniques can be used to generate three-dimensional images. In addition to the imaging and analytical capabilities, JSM-7401 F is also renowned for its high-precision stage control. It has three motorized degrees of freedom and can handle a range of sample sizes with its large travel range. Samples can also be rotated and focused using the high-resolution controls. JSM 7401F is a versatile scanning electron microscope and can be used for a wide range of applications. It can be used to inspect the surface of a sample for defects or to analyze the composition and structure of a material. By combining a range of analytical techniques with its high-quality imaging, JSM-7401F produces precise results with minimal effort.