Used JEOL JSM 7401F #293751819 for sale

JEOL JSM 7401F is a scanning electron microscope (SEM) produced by JEOL. JEOL JSM-7401F is a field emission gun SEM that is capable of capturing detailed images of materials at high resolution. This advanced SEM utilizes high-performance field emission technology, combining a Gun High Tension (GHT) power supply, an electron energy selector, and a Debri-proof chamber for superior imaging. JSM 7401 F provides high-resolution secondary electrons (SE) imaging and cathodoluminescence (CL) imaging with high resolution, low voltage imaging of samples as thin as 50 nm. It also provides a high resolution display of 0.6 nm at 15 kV with excellent contrast and resolution. For superior imaging, JSM-7401F utilizes a high standard 5-micron spot size with a 5-micron chromatic aberration correction equipment (CAC). Additionally, the advanced SEM allows for a wider dynamic range for imaging applied fields with low energy secondary electrons. JSM-7401 F also features a powerful Multi Beam Interface (CMBI) system and a multiple-axis control telescope. This allows the user to optimize imaging conditions that are suitable for any material and application. Furthermore, the Multi Beam Interface unit provides live-video scanning, allowing for quick scanning without image blurring. JEOL JSM 7401 F is designed to be user-friendly and has an intuitive graphical user interface that is fully configurable. This interface makes using the SEM simpler and easier to learn. Also, the SEM supports a range of control protocols, including Ethernet, VME, and CAN. In order to ensure excellent imaging and performance, JEOL JSM-7401 F is equipped with advanced functions such as an auto-focusstabilization mechanism, a beam profile control machine, and a side-illumination module. These features help users to accurately focus the beam and obtain images of samples with improved contrast and resolution. Overall, JSM 7401F is a versatile and powerful scanning electron microscope that is suitable for a wide range of materials and applications. It is able to provide high-resolution images at low voltage, high-performance imaging of samples as thin as 50 nm, and advanced features that help to ensure the best possible imaging.