Used JEOL JSM 7401F #9147359 for sale
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ID: 9147359
Field emission scanning electron microscope (FE-SEM)
Resolution: 1.0nm (15kV), 1.5nm (1kV)
Magnification: 25x to 1,000,000x
Accelerating voltage: 0.1 to 30 kV
Probe current: 10^-13 to 2×10^-9 A
Electron gun: Cold field emission electron gun (Tungsten single crystal emitter)
Objective lens: Strongly excited low aberration conical lens
(3) Electron detectors:
Upper secondary electron in-lens detector (SEI)
Lower secondary electron detector (LEI)
Retractable backscattered electrons detector (RBEI)
IR Camera
Specimen chamber:
Diameter: 8"
Airlock type: 150 (Diameter) × 10 (Height) mm specimen holder
Specimen stage: Eucentric gioniometer stage
3-Axis computer controlled:
X-Y: 70×50mm
Rotation R: 360º
Manual handling of Z-axis: 1.5 up to 25mm
Tilt: -5° up to +70°
Specimen holders:
12.5 (Diameter) × 10(Height) mm
26 (Diameter) × 10(Height) mm
Wafer holders, 3"-4"
STEM Holder
Image process:
2/4 Divided display
Pseudo color
Image processing function (Sharpen, Gaussian, Smooth, Laplacian etc.)
Operating system: Windows XP
Supported image file formats: BMP, JPEG, TIFF
Vacuum system:
(3) Sputter ion pump units for Pgun~10-8Pa
DP-DP Series system
Fore-line trap for P specimen chamber ~ 10-5Pa
Oil rotary pump
2006 vintage.
JEOL JSM 7401F is a scanning electron microscope (SEM) commonly used in applied research. It is renowned for its high-quality imaging, precise sample analysis, and accurate measurements. This scanning electron microscope stands out due its high resolution and allows for magnifications up to 200,000x. JEOL JSM-7401F incorporates features such as a field emission gun (FEG) for high accelerating voltage that produces a stable beam, allowing for accurate imaging and analysis. It also contains two detectors - the secondary electron detector and the backscattered electron detector - that measure the interaction between the electron beam and the sample. This is known as analytical imaging and is a powerful tool for in-depth research. JSM 7401 F uses an X-ray Detector for spectrometry, a technique used for elemental analysis. This helps identify elements in the sample and determine atomic composition. X-ray Detector also allows for X-ray line scanning, spot analysis, and EDX mapping - all used to visualize chemical distributions. For high speed image capture, JEOL JSM-7401 F contains several image capture components. It is equipped with a high-resolution CCD camera that produces digital images with minimal noise. The "High Defocus" feature enhances image quality at higher magnifications and rapid-scanning techniques can be used to generate three-dimensional images. In addition to the imaging and analytical capabilities, JSM-7401 F is also renowned for its high-precision stage control. It has three motorized degrees of freedom and can handle a range of sample sizes with its large travel range. Samples can also be rotated and focused using the high-resolution controls. JSM 7401F is a versatile scanning electron microscope and can be used for a wide range of applications. It can be used to inspect the surface of a sample for defects or to analyze the composition and structure of a material. By combining a range of analytical techniques with its high-quality imaging, JSM-7401F produces precise results with minimal effort.
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