Used JEOL JSM 7401F #9206955 for sale

JEOL JSM 7401F is a scanning electron microscope (SEM) that allows for high-resolution imaging and characterization of specimen materials. This is done by using a focused electron beam that is scanned over the sample. The scanned electrons interact with the material to produce a signal that can be utilized to construct an image. The SEM operates in either a high vacuum or a high-pressure environment, depending on the type of specimen material that is being analyzed. The high vacuum mode creates a low-noise environment to improve the resolution of the imaging and characterization. In the high-pressure mode, a sample environment with a pressure up to 7 MPa is provided to induce various phenomena such as deformation and decomposition of materials. JEOL JSM-7401F also comes with an electron-optical column, providing a scanning electron beam with a minimum spot size of 0.5nm to maximize imaging resolution. Additionally, it includes an in-column gun changer that allows for the exchange of different type of electron guns, such as a field emission gun (FEG), for a wide range of applications. The SEM is built with a high-speed plate system that has a high-precision XY stage with a maximum scanning area of 100x100mm, making it ideal for rapid imaging of large areas. The system's beam acceleration voltage can range from 0.5-30 kV and its beam current ranges from 0.2-50 nA. The system is also equipped with a dedicated signal processor that can acquire signal data up to 10 giga pixels per second. JSM 7401 F is computer-controlled, with an integrated user-friendly graphical user interface to improve user accessibility. All related imaging and signal processing control parameters can be adjusted through the interface, including detection and measurement options to analyze different material parameters. Finally, JSM 7401F has software packages that enable many analytical and analytical functions, including topographic imaging, composition imaging, elemental analysis, and 3D modeling. This SEM is a versatile instrument that can be applied to various fields, like materials science, natural science, and semiconductors.